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NASA NTRS · 19880000321

Dual-Cathode Electron-Beam Source

Abstract

Beam from either cathode electromagnetically aligned with exit port. Electron beam from either of two cathodes deflected by magnetic and electric fields to central axis. Mechanical alignment of beam easy because cathode axes, anode apertures, and electron trajectories coplanar. Applications where uninterrupted service needed: scanning electron microscopes, transmission electron microscopes, electron-beam lithography equipment, Auger instruments, and microfocused x-ray sources.

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BibTeXRIS

Bradley, James G., Conley, Joseph M., Wittry, David B.. 1988-06-01. Dual-Cathode Electron-Beam Source. https://ntrs.nasa.gov/citations/19880000321

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