Temperature Fluctuations During Crystal Growth

Abstract

Technique developed to deconvolve period and relative amplitude of fluctuations of heat flow inBridgman crystal growth. Temperature-measuring device with enough sensitivity and frequency response to make desired measurements inserted close as possible to substance monitored. Time-dependent temperature response recorded, and time domain response converted to frequency domain for further analysis. Fast fourier transform (FFT) of data on temperature oscillations shows particular behavior at some specific frequencies corresponding with striations, or defects observed on crystal. Useful procedure to help determine sources of some growth-induced crystalline defects. Other processes sensitive to small temperature fluctuations, such as diffusion, precipitation, and corrsion, benefit from technique.