NASA NTRS · 19880000518
Self-Testing Computer Memory
Abstract
Memory system for computer repeatedly tests itself during brief, regular interruptions of normal processing of data. Detects and corrects transient faults as single-event upsets (changes in bits due to ionizing radiation) within milliseconds after occuring. Self-testing concept surpasses conventional by actively flushing latent defects out of memory and attempting to correct before accumulating beyond capacity for self-correction or detection. Cost of improvement modest increase in complexity of circuitry and operating time.
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Chau, Savio, N., Rennels, David A.. 1988-11-01. Self-Testing Computer Memory. https://ntrs.nasa.gov/citations/19880000518
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