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NASA NTRS · 19880047207

Hot-spot qualification testing of concentrator modules

Abstract

Results of a study to determine the hot-spot susceptibility of concentrator cells, to provide a hot-spot qualification test for concentrator modules, and to provide guidelines for reducing hot-spot susceptibility are presented. Hot-spot heating occurs in a photovoltaic module when the short-circuit current of a cell is lower than the string operating current, forcing the cell into reverse bias with a concurrent power dissipation. Although the basis for the concentrator-module hot-spot qualification test is the test developed for flat-plate modules, issues such as providing cell illumination introduce additional complexities into the testing procedure. The results indicate that the same general guidelines apply to protecting concentrator modules from hot-spot stressing as apply to flat-plate modules, and recommendations are made on the number of bypass diodes required per given number of series cells per module or source circuit. A method for determining the cell temperature in the laboratory or in the field is discussed.

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BibTeXRIS

Gonzalez, C. C., Sugimura, R. S., Ross, R. G., Jr.. 1987-01-01. Hot-spot qualification testing of concentrator modules. https://ntrs.nasa.gov/citations/19880047207

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