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NASA NTRS ยท 19880064690

Instrumentation and data acquisition electronics for free-flight drop model testing

Abstract

This paper presents instrumentation and data acquisition electronics techniques used in free-flight drop model testing at the NASA Langley Research Center. Free-flight drop model testing is a technique for conducting complex aircraft controls research using reduced scale models of experimental aircraft. An introduction to the Free-Flight Drop Model Program is presented first. This is followed by a description of the recently upgraded airborne and ground based instrumentation and data acquisition electronics. Lastly current and future development efforts and opportunities are discussed.

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BibTeXRIS

Carraway, Preston I., III. 1988-09-01. Instrumentation and data acquisition electronics for free-flight drop model testing. https://ntrs.nasa.gov/citations/19880064690

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