NASA NTRS · 19890003578
Polarimetric microwave scattering from known randomly rough surfaces
Abstract
Scattering from rough surfaces is reviewed, and artificial randomly rough surfaces are described. Measurements were made from 4 to 18 GHz for the 4 linear polarization states. The target consists of a metalized randomly rough surface constructed from known surface statistical information. The surface was generated using surface generation routines on the computer, and then the data was converted for the machining of the surface on a computer controlled mill. Bistatic and monostatic measurements were acquired at incident angles from 25 to 60 deg. At the 13.5 to 18 GHz frequencies, the effects of backscatter enhancement and depolarization effects can be studied in a regime which does not satisfy Kirchoff or small perturbation assumptions. This allows scattering mechanisms to be introduced into models, which may show missing elements in the more standard formulations. At lower frequency bands such as 4 to 8.5 GHz the scattering behavior was also examined to see the behavior as assumptions of other formulations are satisfied.
Keep this discovery
Explore connections, maps & timelines
Nance, C. E., Blanchard, A. J., Chen, M. F.. 1988-08-01. Polarimetric microwave scattering from known randomly rough surfaces. https://ntrs.nasa.gov/citations/19890003578
Cite the original work for its findings. Save a collection to share your selection of sources.