Dual wavelength holographic interferometry system

Abstract

The present invention relates to a two-wave holographic interferometry system and method. In such systems, a reference beam holographic is super-imposed on an object beam, the object beam being an image obtained by passing as beam through an object regarding which some parameter (e.g., temperature gradient) is to be measured. A photograph of the superimposed beams is taken. The present invention employs to object and two reference beams and the invention is particularly concerned with the use of a prism assembly which causes the two different wavelengths of the object beams to emerge from the prism at slightly different angles, thereby providing two holographic images which are slightly displaced from each other.