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NASA NTRS ยท 19890016847

Two-dimensional high temperature optical strain measurement system, phase 2

Abstract

A laser speckle strain measurement system with two-dimensional measurement capabilities has been built and tested for high temperature applications. The 1st and 2nd principle strains at a point on a specimen are calculated from three components of one-dimensional strain. Strain components are detected by cross-correlating reference and shifted speckle patterns recorded before and after straining the specimen. Speckle patterns are recorded by a linear photodiode array camera. Accurate strains have been measured at temperatures up to 650 C. Stable speckle correlations and linear stress-strain relations have been demonstrated up to 750 C. The resolution of the system is 15 microstrains, with a gauge length less than 1 mm.

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BibTeXRIS

Lant, Christian T.. 1989-07-01. Two-dimensional high temperature optical strain measurement system, phase 2. https://ntrs.nasa.gov/citations/19890016847

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