Digitally modulated bit error rate measurement system for microwave component evaluation

Abstract

The NASA Lewis Research Center has developed a unique capability for evaluation of the microwave components of a digital communication system. This digitally modulated bit-error-rate (BER) measurement system (DMBERMS) features a continuous data digital BER test set, a data processor, a serial minimum shift keying (SMSK) modem, noise generation, and computer automation. Application of the DMBERMS has provided useful information for the evaluation of existing microwave components and of design goals for future components. The design and applications of this system for digitally modulated BER measurements are discussed.