NASA NTRS · 19900000495
Holographic Reticle
Abstract
Holographic reticle proposed for use in nondestructive evaluation of surface irregularities. Extends inspection capability to include measurements of depth. Surfaces inspected without contamination, damage, or costly disassembly. Provides valuable information difficult to obtain. For example, surface defects as corrosion and porosity, as well as propagation of cracks, measured accurately. Roughness, wear, and plating thickness also measured. Also used to determine quality of microcircuits.
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Henn, Edward A., Scribner, Marc M.. 1990-09-01. Holographic Reticle. https://ntrs.nasa.gov/citations/19900000495
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