NASA NTRS · 19900000542
Monitoring Small Deformations In An Instrument
Abstract
Relatively simple source/detector pairs measure changes affecting optical alignment. System for monitoring small thermal, gravitational, and dynamical deformations in x-ray telescope includes two sources of infrared light, each associated with dual-axis, position-sensing photodiode. Principle of operation straightforward and applicable to monitoring of small lateral translations and/or rotations between different parts in machinery, buildings, bridges, ships, and other large structures.
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Hagopian, John G., Northcutt, William. 1990-10-01. Monitoring Small Deformations In An Instrument. https://ntrs.nasa.gov/citations/19900000542
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