Linear digital imaging system fidelity analysis

Abstract

The combined effects of imaging gathering, sampling and reconstruction are analyzed in terms of image fidelity. The analysis is based upon a standard end-to-end linear system model which is sufficiently general so that the results apply to most line-scan and sensor-array imaging systems. Shift-variant sampling effects are accounted for with an expected value analysis based upon the use of a fixed deterministic input scene which is randomly shifted (mathematically) relative to the sampling grid. This random sample-scene phase approach has been used successfully by the author and associates in several previous related papers.