NASA NTRS ยท 19900010292
Development of inspection techniques for quantitatively measuring surface contamination on SRM hardware
Abstract
A contaminant is any material or substance which is potentially undesirable or which may adversely affect any part, component, or assembly. Contamination control of SRM hardware surfaces is a serious concern, for both Thiokol and NASA, with particular concern for contaminants which may adversely affect bonding surfaces. The purpose of this study is to develop laboratory analytical techniques which will make it possible to certify the cleanliness of any designated surface, with special focus on particulates (dust, dirt, lint, etc.), oils (hydrocarbons, silicones, plasticizers, etc.), and greases (HD-2, fluorocarbon grease, etc.). The hardware surfaces of concern will include D6AC steel, aluminum alloys, anodized aluminum alloys, glass/phenolic, carbon/phenolic, NBR/asbestos-silica, and EPDM rubber.
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Law, R. D.. 1989-10-13. Development of inspection techniques for quantitatively measuring surface contamination on SRM hardware. https://ntrs.nasa.gov/citations/19900010292
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