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NASA NTRS · 19900018554

Optical and microwave detection using Bi-Sr-Ca-Cu-O thin films

Abstract

Recent progress at the Johns Hopkins University Applied Physics Laboratory (JHU/APL) in the development of optical and microwave detectors using high temperature superconducting thin films is described. Several objectives of this work have been accomplished, including: deposition of Bi-Sr-Ca-Cu-O thin films by laser abation processing (LAP); development of thin film patterning techniques, including in situ masking, wet chemical etching and laser patterning; measurements of bolometric and non-bolometric signatures in patterned Bi-Sr-Ca-Cu-O films using optical and microwave sources, respectively; analysis and design of an optimized bolometer through computer simulation, and investigation of its use in a Fourier transform spectrometer. The focus here is primarily on results from the measurement of the bolometric and non-bolometric response.

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BibTeXRIS

Grabow, B. E., Sova, R. M., Boone, B. G., Moorjani, K., Kim, B. F., Bohandy, J., Adrian, F., Green, W. J.. 1990-04-01. Optical and microwave detection using Bi-Sr-Ca-Cu-O thin films. https://ntrs.nasa.gov/citations/19900018554

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