NASA NTRS · 19900018715
Progress in high temperature speckle-shift strain measurement system
Abstract
A fast, easy to use speckle tracking system is under development for the speckle-shift strain measurement technique. Preliminary correlation tests on wire specimens show strong correlations of well-developed speckle patterns. Stable cross-correlations were obtained from a tungsten filament at 2480 C. An analysis of the optical system determines the minimum required sampling frequency of the speckle pattern to be 2.55 pixels per speckle.
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Lant, Christian T., Barranger, John P.. 1990-01-01. Progress in high temperature speckle-shift strain measurement system. https://ntrs.nasa.gov/citations/19900018715
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