Test chamber for low-background IR focal plane testing

Abstract

A unique and versatile vacuum chamber has been designed for JPL's IR Focal Plane Technology Group. This chamber is equipped with multiple ports for cryogen and electrical vacuum feedthroughs, pumping units, vacuum gages, sources, and detector camera heads. The design incorporates a liquid-nitrogen-cooled optical table and radiation shield for low-background IR detector testing. Focal planes can be tested at temperatures ranging from 300 K to that of liquid helium. This paper describes the design and construction of this low-background IR focal plane test chamber and discusses some of its distinctive features. An analysis of the test chamber's performance is also presented.