Development of a normal incidence multilayer, imaging X-ray microscope

Abstract

This paper describes the design, analysis, and fabrication of a normal-incidence multilayer 20x Schwarzschild imaging X-ray microscope. The microscope is being fabricated using much of the technology implemented in the Multispectral Solar Telescope Array. Results of diffraction analysis show that better than 400 A spatial resolution in the object plane up to a 1-mm field of view can be achieved with 125 A radiation. Other microscope systems for use in conjunction with X-ray telescopes are analyzed and designed.