NASA NTRS · 19910000377
Designing Accelerated Tests Of Electromigration
Abstract
Method for design of accelerated tests of electromigration (as in microscopic conductors in integrated circuits) based partly on simplified mathematical model of electromigration and partly on error analysis. Objective to determine quickly operating life of tested components under normal operating conditions by extrapolation from lifetime measurements at operating stresses greater than normal. Involves compromise between reducing testing time by increasing stresses and reducing uncertainty in extrapolated lifetime by decreasing stresses.
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Buehler, Martin G.. 1991-08-01. Designing Accelerated Tests Of Electromigration. https://ntrs.nasa.gov/citations/19910000377
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