NASA NTRS · 19910004736
Total-dose radiation effects data for semiconductor devices (1989 supplement)
Abstract
Steady state, total dose radiation test data are provided for electronic designers and other personnel using semiconductor devices in a radiation environment. The data are presented in graphic and narrative formats. Two primary radiation source types were used: Cobalt-60 gamma rays and a Dynamitron electron accelerator capable of delivering 2.5 MeV electrons at a steady rate.
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Martin, Keith E., Coss, James R., Goben, Charles A., Shaw, David C., Farmanesh, Sam, Davarpanah, Michael M., Craft, Leroy H., Price, William E.. 1990-02-15. Total-dose radiation effects data for semiconductor devices (1989 supplement). https://ntrs.nasa.gov/citations/19910004736
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