NASA NTRS · 19910015754
Post-flight characterization of optical system samples, thermal control samples, and detectors from LDEF experiment M0003, sub-experiments 6 and 13
Abstract
Flight samples and control samples of optical and thermal control coatings were measured for hemispheric reflectance and transmission. The samples were exposed directly to the orbital environment, but were on the trailing edge of the LDEF satellite. Preliminary analysis shows no significant change in the reflectance of transmission values of most of the samples. Post-flight tests of avalanche photodiodes is also discussed.
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Hodgson, Randall R., Holsen, James N., Drerup, Robert A., Jr.. 1991-06-01. Post-flight characterization of optical system samples, thermal control samples, and detectors from LDEF experiment M0003, sub-experiments 6 and 13. https://ntrs.nasa.gov/citations/19910015754
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