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NASA NTRS · 19910030307

Simulated fault injection - A methodology to evaluate fault tolerant microprocessor architectures

Abstract

A simulation-based fault-injection method for validating fault-tolerant microprocessor architectures is described. The approach uses mixed-mode simulation (electrical/logic analysis), and injects transient errors in run-time to assess the resulting fault impact. As an example, a fault-tolerant architecture which models the digital aspects of a dual-channel real-time jet-engine controller is used. The level of effectiveness of the dual configuration with respect to single and multiple transients is measured. The results indicate 100 percent coverage of single transients. Approximately 12 percent of the multiple transients affect both channels; none result in controller failure since two additional levels of redundancy exist.

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BibTeXRIS

Choi, Gwan S., Iyer, Ravishankar K., Carreno, Victor A.. 1990-10-01. Simulated fault injection - A methodology to evaluate fault tolerant microprocessor architectures. https://ntrs.nasa.gov/citations/19910030307

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