NASA NTRS · 19910042366
Electromigration failure in YBa2Cu3O(7-x) thin films
Abstract
Electromigration failure in highly oriented YBa2Cu3O(7-x) thin films below the superconducting transition temperature is reported here for the first time. The film on SrTiO3 failed at 86 K, 230,000 A/sq cm, while that on LaAlO3 failed at 84 K, 930,000 A/sq cm. Scanning electron microscopy and energy dispersive X-ray analysis of the films after failure shows that Cu migrates preferentially away from the failure region toward the electrode.
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Vitta, Satish, Stan, M. A., Warner, J. D., Alterovitz, S. A.. 1991-02-18. Electromigration failure in YBa2Cu3O(7-x) thin films. https://ntrs.nasa.gov/citations/19910042366
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