Demagnetization effects on forward and reverse thresholds of M-R memory elements

Abstract

A refinement in the way hard-axis demagnetizing effects are treated in multilayer M-R memory elements brings experimental and calculated results into agreement for both the forward and reverse switching thresholds. In the improved model, the nonuniform rotation of the magnetization in the elements because of edge pinning is taken into account. The demagnetizing fields are treated as corrections to the hard-axis word field rather than an addition to the anisotropy constant.