NASA NTRS · 19910061382
Quantum efficiency measurements of Tektronix backside thinned CCDs
Abstract
Results are presented of a program in progress to produce CCDs with high stable quantum efficiency (QE). Measurements made at 253.7 nm over a six-month period showed no significant QE difference between two CCDs manufactured in 1989 and one manufactured in 1988. QE improvement by the addition of a two-layer antireflection coating is about threefold at 400 nm.
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Delamere, Alan, Atkinson, Mike, Rice, James P., Blouke, Morley, Reed, Richard. 1990-01-01. Quantum efficiency measurements of Tektronix backside thinned CCDs. https://ntrs.nasa.gov/citations/19910061382
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