NASA NTRS · 19920000073
Single-Event-Upset Laser Scanner With Optical Bias
Abstract
Light-assisted microelectronic advanced laser scanner (LAMEALS) is augmented version of microelectronic advanced laser scanner (MEALS) described in article, "Laser Scanner Tests For Single-Event Upsets", (NPO-18216). Only major difference, steady illumination from helium/neon laser, argon-ion laser, and/or other source(s) combined with pulsed dye-laser illumination of MEALS into single illuminating beam.
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Kim, Quiesup. 1992-02-01. Single-Event-Upset Laser Scanner With Optical Bias. https://ntrs.nasa.gov/citations/19920000073
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