NASA NTRS · 19920005077
Silicon device performance measurements to support temperature range enhancement
Abstract
The results of the NPN bipolar transistor (BJT) (2N6023) breakdown voltage measurements were analyzed. Switching measurements were made on the NPN BJT, the insulated gate bipolar transistor (IGBT) (TA9796) and the N-channel metal oxide semiconductor field effect transistor (MOSFET) (RFH75N05E). Efforts were also made to build a H-bridge inverter. Also discussed are the plans that have been made to do life testing on the devices, to build an inductive switching test circuit and to build a dc/dc switched mode converter.
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Johnson, R. Wayne, Askew, Ray, Bromstead, James, Weir, Bennett. 1991-12-02. Silicon device performance measurements to support temperature range enhancement. https://ntrs.nasa.gov/citations/19920005077
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