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NASA NTRS ยท 19920007361

Application of machine learning and expert systems to Statistical Process Control (SPC) chart interpretation

Abstract

Statistical Process Control (SPC) charts are one of several tools used in quality control. Other tools include flow charts, histograms, cause and effect diagrams, check sheets, Pareto diagrams, graphs, and scatter diagrams. A control chart is simply a graph which indicates process variation over time. The purpose of drawing a control chart is to detect any changes in the process signalled by abnormal points or patterns on the graph. The Artificial Intelligence Support Center (AISC) of the Acquisition Logistics Division has developed a hybrid machine learning expert system prototype which automates the process of constructing and interpreting control charts.

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BibTeXRIS

Shewhart, Mark. 1991-09-01. Application of machine learning and expert systems to Statistical Process Control (SPC) chart interpretation. https://ntrs.nasa.gov/citations/19920007361

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