The Berkeley EUV spectrometer for ORFEUS

Abstract

A novel EUV spectrometer is presented for the ORFEUS-SPAS mission. It uses a set of four varied line-space spherical diffraction gratings to obtain high-resolution spectra of point sources at wavelengths between 390 and 1200 A. The spectra are recorded with two detector units, each containing curved-surface microchannel plates and a delay-line anode-readout system. An independent optical system detects the image of the source in the entrance aperture and tracks the source as it drifts during an observation, enabling a reconstruction of the spectra postflight. The overall system performance is discussed and illustrated by synthetic spectra.