NASA NTRS · 19930004484
High temperature strain gage apparent strain compensation
Abstract
Once an installed strain gage is connected to a strain indicating device and the instrument is balanced, a subsequent change in temperature of the gage installation will generally produce a resistance change in the gage. This purely temperature-induced resistance will be registered by the indicating device as a strain and is referred to as 'apparent strain' to distinguish it from strain due to applied stress. One desirable technique for apparent strain compensation is to employ two identical gages with identical mounting procedures which are connected with a 'half bridge' configuration where gages see the same thermal environment but only one experiences a mechanical strain input. Their connection in adjacent arms of the bridge will then balance the thermally induced apparent strains and, in principle, only the mechanical strain remains. Two approaches that implement this technique are discussed.
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Holmes, Harlan K., Moore, T. C., Sr.. 1992-09-01. High temperature strain gage apparent strain compensation. https://ntrs.nasa.gov/citations/19930004484
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