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NASA NTRS · 19930019096

LDEF materials data analysis: Representative examples

Abstract

Part of the philosophy which guided the examination of hardware from the Long Duration Exposure Facility (LDEF) was that materials present at multiple locations should have fairly high priority for investigation. Properties of such materials were characterized as a function of exposure conditions to obtain as much data as possible for predicting performance lifetimes. Results from examination of several materials from interior locations of LDEF, selected measurements on silverized teflon blanket specimens, and detailed measurements on the copper grounding strap from tray D11 are summarized. Visual observations of interior locations of LDEF made during deintegration at KSC showed apparent changes in particular specimens. This inspection lead to testing of selected nylon clamps, fiberglass shims, and heat shrink tubing from wire harness clamps, and visually discolored silver coated hex nuts.

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BibTeXRIS

Pippin, Gary, Crutcher, Russ. 1993-04-01. LDEF materials data analysis: Representative examples. https://ntrs.nasa.gov/citations/19930019096

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