NASA NTRS · 19940000111
Determining Directional Emittance With An Infrared Imager
Abstract
Directional emittances of flat specimen of smooth-surfaced, electrically nonconductive material at various temperatures computed from measurements taken by infrared radiometric imager operating in conjunction with simple ancillary equipment. Directional emittances useful in extracting detailed variations of surface temperatures from infrared images of curved, complexly shaped other specimens of same material. Advantages: simplification of measurement procedure and reduction of cost.
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Daryabeigi, Kamran, Alderfer, David W., Wright, Robert E., Jr., Puram, Chith K.. 1994-02-01. Determining Directional Emittance With An Infrared Imager. https://ntrs.nasa.gov/citations/19940000111
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