NASA NTRS · 19940000657
Automated System Tests High-Power MOSFET's
Abstract
Computer-controlled system tests metal-oxide/semiconductor field-effect transistors (MOSFET's) at high voltages and currents. Measures seven parameters characterizing performance of MOSFET, with view toward obtaining early indication MOSFET defective. Use of test system prior to installation of power MOSFET in high-power circuit saves time and money.
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Huston, Steven W., Wendt, Isabel O.. 1994-12-01. Automated System Tests High-Power MOSFET's. https://ntrs.nasa.gov/citations/19940000657
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