NASA NTRS · 19940000672
Improvements In Optically Stimulated Electron Emission
Abstract
Optically stimulated electron emission (OSEE) used in inspection for contamination of critical bonding surfaces in solid rocket motors of Space Shuttle prior to formation of adhesive bonds on surfaces during manufacture and refurbishment. Fundamental OSEE inspection technique described in "Surface-Contamination Inspection Tool for Field Use" (MFS-25581) and "Detecting Contamination With Photoelectron Emission" (MFS-25619). OSEE measurement head easily portable, and measurement operation convenient and rapid, making it useful inspection technique in industrial environment. Reveals contamination in many situations in which other techniques do not work.
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Yost, William T., Welch, Christopher S., Joe, Edmond J., Hefner, Bill B., Jr.. 1994-12-01. Improvements In Optically Stimulated Electron Emission. https://ntrs.nasa.gov/citations/19940000672
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