Supply Current Diagnosis in VLSI

Abstract

This paper presents a technique based upon the power supply current signature (cd) which allows for the testing of mixed-signal systems, in situ. Through experiments with a microprocessor, the cd is shown to contain important information concerning the operational status of the system which may be easily extracted using approaches based on statistical signal detection theory. The fault-detection performance of these techniques is compared to that achieved through auto-regressive modeling of the cd.