NASA NTRS · 19940013883
Measurement selection for parametric IC fault diagnosis
Abstract
Experimental results obtained with the use of measurement reduction for statistical IC fault diagnosis are described. The reduction method used involves data pre-processing in a fashion consistent with a specific definition of parametric faults. The effects of this preprocessing are examined.
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Wu, A., Meador, J.. 1991-01-01. Measurement selection for parametric IC fault diagnosis. https://ntrs.nasa.gov/citations/19940013883
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