NASA NTRS ยท 19940020652
Microwave techniques for physical property measurements
Abstract
Industrial processing of metals and ceramics is now being streamlined by the development of theoretical models. High temperature thermophysical properties of these materials are required to successfully apply these theories. Unfortunately, there is insufficient experimental data available for many of these properties, particularly in the molten state. Microwave fields can be used to measure specific heat, thermal diffusivity, thermal conductivity and dielectric constants at high temperatures. We propose to (1) develop a microwave flash method (analogous to the laser flash technique) that can simultaneously measure the thermal diffusivity and specific heat of insulators and semiconductors at high temperatures, (2) an appropriate theory and experimental apparatus to demonstrate the measurement of the specific heat of a metal using a new microwave ac specific heat technique, and (3) experimental methods for noncontact measurement of the real and imaginary dielectric constants.
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Barmatz, M.. 1993-11-01. Microwave techniques for physical property measurements. https://ntrs.nasa.gov/citations/19940020652
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