Search NASAโŒ• Search

NASA NTRS ยท 19950021927

Extended linear ion trap frequency standard apparatus

Abstract

A linear ion trap for frequency standard applications is provided with a plurality of trapping rods equally spaced and applied quadruple rf voltages for radial confinement of atomic ions and biased level pins at each end for axial confinement of the ions. The trapping rods are divided into two linear ion trap regions by a gap in each rod in a common radial plane to provide dc discontinuity, thus dc isolating one region from the other. A first region for ion-loading and preparation fluorescence is biased with a dc voltage to transport ions into a second region for resonance frequency comparison with a local oscillator derived frequency while the second region is held at zero voltage. The dc bias voltage of the regions is reversed for transporting the ions back into the first region for fluorescence measurement. The dual mode cycle is repeated continuously for comparison and feedback control of the local oscillator derived frequency. Only the second region requires magnetic shielding for the resonance function which is sensitive to any ambient magnetic fields.

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Prestage, John D.. 1995-05-30. Extended linear ion trap frequency standard apparatus. https://ntrs.nasa.gov/citations/19950021927

Cite the original work for its findings. Save a collection to share your selection of sources.