Material Measurements Using Groundplane Apertures

Abstract

A technique for material parameter determination using an aperture in a groundplane is studied. The material parameters are found by relating the measured reflected field in the aperture to a numerical model. Two apertures are studied which can have a variety of different material configurations covering the aperture. The aperture cross-sections studied are rectangular and coaxial. The material configurations involved combinations of single layer and dual layers with or without a resistive exterior resistive sheet. The resistivity of the resistive sheet can be specified to simulate a perfect electric conductor (PEC) backing (0 Ohms/square) to a free space backing (infinity Ohms/square). Numerical parameter studies and measurements were performed to assess the feasibility of the technique.