Microwave imaging of metal objects

Abstract

The procedure of microwave imaging by maximum entropy method is discussed. First, the relationship between the induced current on the metal object surface and the scattered field is introduced. Our imaging concept is to reconstruct the induced current on the object surface from the measured scattered field. The object configuration will be provided by the induced current which is zero everywhere except on the object surface. Future work is also included with focus on the application of microwave imaging to both NASA and industry.