NASA NTRS · 19970004270
Method of Testing and Predicting Failures of Electronic Mechanical Systems
Abstract
A method employing a knowledge base of human expertise comprising a reliability model analysis implemented for diagnostic routines is disclosed. The reliability analysis comprises digraph models that determine target events created by hardware failures human actions, and other factors affecting the system operation. The reliability analysis contains a wealth of human expertise information that is used to build automatic diagnostic routines and which provides a knowledge base that can be used to solve other artificial intelligence problems.
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Iverson, David L., Patterson-Hine, Frances A.. 1996-12-03. Method of Testing and Predicting Failures of Electronic Mechanical Systems. https://ntrs.nasa.gov/citations/19970004270
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