NASA NTRS · 19970015517
Current Problems in X-Ray Emission Spectroscopy
Abstract
Various problems that limit X-ray analysis in the analytical electron microscope are reviewed. Major emphasis is given to the trade-off between minimum mass fraction and spatial resolution. New developments such as high-brightness electron guns, new X-ray spectrometers and clean high-vacuum analysis conditions will lead to major improvements in the accuracy and detectability limits of X-ray emission spectroscopy.
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Goldstein, Joseph I., Williams, David B., Lyman, Charles E.. 1989-01-01. Current Problems in X-Ray Emission Spectroscopy. https://ntrs.nasa.gov/citations/19970015517
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