NASA NTRS · 19980033575
Rad-Hard/HI-REL FPGA
Abstract
The goals for a radiation hardened (RAD-HARD) and high reliability (HI-REL) field programmable gate array (FPGA) are described. The first qualified manufacturer list (QML) radiation hardened RH1280 and RH1020 were developed. The total radiation dose and single event effects observed on the antifuse FPGA RH1280 are reported on. Tradeoffs and the limitations in the single event upset hardening are discussed.
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Jih-Jong Wang, Brian E Cronquist, John E McGowan, Richard B Katz. 1997-07-01. Rad-Hard/HI-REL FPGA. https://ntrs.nasa.gov/citations/19980033575
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