Sequential Testing Algorithms for Multiple Fault Diagnosis

Abstract

In this paper, we consider the problem of constructing optimal and near-optimal test sequencing algorithms for multiple fault diagnosis. The computational complexity of solving the optimal multiple-fault isolation problem is super-exponential, that is, it is much more difficult than the single-fault isolation problem, which, by itself, is NP-hard. By employing concepts from information theory and AND/OR graph search, we present several test sequencing algorithms for the multiple fault isolation problem. These algorithms provide a trade-off between the degree of suboptimality and computational complexity. Furthermore, we present novel diagnostic strategies that generate a diagnostic directed graph (digraph), instead of a diagnostic tree, for multiple fault diagnosis. Using this approach, the storage complexity of the overall diagnostic strategy reduces substantially. The algorithms developed herein have been successfully applied to several real-world systems. Computational results indicate that the size of a multiple fault strategy is strictly related to the structure of the system.