NASA NTRS ยท 19990032184
Surface Diagnostics in Tribology Technology and Advanced Coatings Development
Abstract
This paper discusses the methodologies used for surface property measurement of thin films and coatings, lubricants, and materials in the field of tribology. Surface diagnostic techniques include scanning electron microscopy, transmission electron microscopy, atomic force microscopy, stylus profilometry, x-ray diffraction, electron diffraction, Raman spectroscopy, Rutherford backscattering, elastic recoil spectroscopy, and tribology examination. Each diagnostic technique provides specific measurement results in its own unique way. In due course it should be possible to coordinate the different pieces of information provided by these diagnostic techniques into a coherent self-consistent description of the surface properties. Examples are given on the nature and character of thin diamond films.
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Miyoshi, Kazuhisa. 1999-02-01. Surface Diagnostics in Tribology Technology and Advanced Coatings Development. https://ntrs.nasa.gov/citations/19990032184
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