NASA NTRS · 19990070938
Exploiting Defect Clustering to Screen Bare Die for Infant Mortality Failure: An Experimental Study
Abstract
We present the first experimental results to establish that a binning strategy based on defect clustering can be used to screen bare die for early life failures. The data for this study comes from the SEMATECH test methods experiment.
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Lakin, David R., II, Singh, Adit D.. 1999-01-01. Exploiting Defect Clustering to Screen Bare Die for Infant Mortality Failure: An Experimental Study. https://ntrs.nasa.gov/citations/19990070938
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