Correction Factor for Gaussian Deconvolution of Optically Thick Linewidths in Homogeneous Sources

Abstract

Profiles of optically thick, non-Gaussian emission line profiles convoluted with Gaussian instrumental profiles are constructed, and are deconvoluted on the usual Gaussian basis to examine the departure from accuracy thereby caused in "measured" linewidths. It is found that "measured" linewidths underestimate the true linewidths of optically thick lines, by a factor which depends on the resolution factor r congruent to Doppler width/instrumental width and on the optical thickness tau(sub 0). An approximating expression is obtained for this factor, applicable in the range of at least 0 <= tau(sub 0) <= 10, which can provide estimates of the true linewidth and optical thickness.