Search NASA⌕ Search

NASA NTRS · 20000021508

Interferometry in the Extreme Ultraviolet and X-Ray

Abstract

We report on demonstration of an x-ray interferometer that uses plane mirrors at grazing incidence to create interference fringes in the extreme ultraviolet and soft x-ray portions of the spectrum. X-ray interferometry has historically been implemented through narrow band, diffractive systems that split the wavefront. Our system, by using two separate optical channels to create interference from two areas of the wavefront, has broad band response and much higher efficiency. We discuss some applications of this technique to astronomy and microscopy including the possibility of eventually capturing a micro-arcsecond image of a black hole.

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Cash, W., Shipley, A., Osterman, S., Joy, M. K.. 2000-01-01. Interferometry in the Extreme Ultraviolet and X-Ray. https://ntrs.nasa.gov/citations/20000021508

Cite the original work for its findings. Save a collection to share your selection of sources.