NASA NTRS · 20000056938
Space Radiation Effects and Hardness Assurance for Linear Integrated Circuits
Abstract
New effects that complicate the application of linear devices in space are discussed, including enhanced damage at low dose rate and proton damage, which cause permanent degradation. Transients produced by protons and heavy ions are also discussed.
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Johnston, A. H.. 2000-01-01. Space Radiation Effects and Hardness Assurance for Linear Integrated Circuits. https://ntrs.nasa.gov/citations/20000056938
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