NASA NTRS · 20010092700
Process-Induced Carbon and Sub-Layer in SiC/BN/SiC Composites: Characterization and Consequences
Abstract
Following our detection of films of elemental carbon in the Hi-Nicalon TM/BN/SiC composite and its deleterious effect on oxidative durability, we have examined other SiC/BN/SiC systems. The problem is pervasive, and significant residues of free carbon are confirmed in Sylramic /BN/SiC materials. Effective techniques for routine detection and characterization of adventitious carbon in SiC/BN/SiC composites are discussed.
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Ogbuji, L. U. J. T, Wheeler, D. R., McCue, T. R.. 2001-07-01. Process-Induced Carbon and Sub-Layer in SiC/BN/SiC Composites: Characterization and Consequences. https://ntrs.nasa.gov/citations/20010092700
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