NASA NTRS · 20020083309
Profiling System
Abstract
A non-destructive testing system, originally developed for Langley Research Center, is sold commercially. The DyLASP Profilometer locates defects in composite and metallic materials and assemblies. It operates in real time and displays results as a contour map of the assembly with defects indicated by size and location. Applications are in non-destructive testing and evaluation, and the company will customize to user requirements.
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1992-01-01. Profiling System. https://ntrs.nasa.gov/citations/20020083309
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